[PDF.24as] Advances in Imaging and Electron Physics, Volume 157: Optics of Charged Particle Analyzers

Advances in Imaging and Electron Physics, Volume 157: Optics of Charged Particle Analyzers

[PDF.ll49] Advances in Imaging and Electron Physics, Volume 157: Optics of Charged Particle Analyzers

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 | #6419228 in Books |  Hawkes Peter W |  2009-08-07 | Original language:English | PDF # 1 |  9.02 x.94 x5.98l,1.67 | File type: PDF | 373 pages

 | Advances in Imaging and Electron Physics Volume 157 Optics of Charged Particle Analyzers

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||0 of 0 people found the following review helpful.| The Ideal Book for Beginners and Professionals in Ion Optics and Mass Spectrometry|By Timo Dickel|This is the book, where I think, many people have waited for. It not only describes and explains the language and basics of ion optics in a new easily understandable way, but also the underlying principles of many systems (e. g., magnetic, electrostatic, RF-electric) are explained.|About the Author||Peter Hawkes graduated from the University of Cambridge and subsequently obtained his PhD in the Electron Microscopy Section of the Cavendish Laboratory. He remained there for several years, working on electron optics and digital image processi

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the comp...

You easily download any file type for your device.Advances in Imaging and Electron Physics, Volume 157: Optics of Charged Particle Analyzers   |  Mikhail Yavor. A good, fresh read, highly recommended.

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