[PDF.50jn] Advances in Imaging and Electron Physics, Volume 161: Optics of Charged Particle Analyzers

Advances in Imaging and Electron Physics, Volume 161: Optics of Charged Particle Analyzers

[PDF.xj85] Advances in Imaging and Electron Physics, Volume 161: Optics of Charged Particle Analyzers

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 | #6267357 in Books |  2010-04-06 | Original language:English | PDF # 1 |  9.25 x6.25 x.75l,1.15 | File type: PDF | 304 pages

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||About the Author||Peter Hawkes graduated from the University of Cambridge and subsequently obtained his PhD in the Electron Microscopy Section of the Cavendish Laboratory. He remained there for several years, working on electron optics and digital image processi

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.

This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the...

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